This list may not be exhaustive or up-to-date. Please contact us with your beamline details or, alternatively, you can edit the list directly by becoming a member of the GitHub group that administers this webpage: contact Andrew.
Table of Synchrotron X-ray reflectometry instruments
At synchrotron and free electron laser Light Sources there are many instruments that can be used for X-ray reflectometry. Please find a list of suggestions below. For a complete list of all x-ray scattering beamlines in Europe please visit, Way For Light database. (please note that the Way for Light database includes instruments that may use the term reflectometry to refer to some spectroscopy techniques rather than in sense used here).
Diamond Light Source has a good set of definitions of the various techniques that are possible at synchrotrons. Acronyms used in the table below are consistent with these definitions.
| Facility | Country | Instrument | Reflectometry on Liquid surfaces | Polarisation | Energy Range | Other techniques | Beamline Publications |
|---|---|---|---|---|---|---|---|
| AichiSR | Japan | BL8S1 General Material Evaluation II | No | Horizontal (linear) | 9.3-14.6keV | GIXD & more | |
| ALBA | USA | BL29 - BOREAS MARES UHV reflectometer | No | linear or circular | 80-4000 eV | resonant magnetic scattering and GISAXS | |
| APS | USA | 4-ID-D | No | linear or circular (polarization control: 2.7 to 15 keV) | 2.7-40keV | Magnetic Spectroscopy, resonant and low-energy diffraction | |
| APS | USA | 15-ID: Liquid Interface Scattering | Yes | horizontal (linear) | 5-70keV | GID, GISAXS & more | |
| BSRF | China | 1W1A Diffuse X-ray Scattering | No | Horizontal (linear) | 8 kev, 13.9 keV | XRD, GIXRD | |
| Diamond | UK | I07 Surface and Interface Diffraction | Yes | horizontal (linear) | 4-45keV | GIXD, GISAXS | 2012, 2016 |
| Diamond | UK | I10 BLADE | No | linear or circular | 0.4-2keV | XAS, XMCD, Soft X-ray Diffraction & more | |
| Diamond | UK | I16 Materials and Magnetism | No | linear or circular | 3.3-25keV | GIXD, WAXS & more | |
| ESRF (German CRG) | France | BM20 ROBL | No | horizontal (linear) | 3.5-35keV | GIXD & Resonant Anomalous X-ray Reflectometry, XAS, XES | |
| ESRF (Spansih CRG) | France | BM25 SpLine | No | horizontal (linear) | 5-35keV | GIXD, XPS | |
| ESRF (UK CRG) | France | BM28 XMaS | No | horizontal (linear) | 2.4-15keV | GIXD, GISAXS, SAXS, XAS & more | |
| ESRF (French CRG) | France | BM32 InterFace Beamline | No | horizontal (linear) | 7-30keV | GIXD, XAS & more | |
| ESRF | France | ID10 Soft interfaces and coherent scattering | Yes | horizontal (linear) | 7-24keV | GIXD, GISAXS & more | |
| ESRF | France | ID31 High-energy beamline for buried interface structure and materials processing | Yes | horizontal (linear) | 21-150keV | GIXD, GISAXS & more | |
| Indus-2 | India | BL-3 Soft x-ray reflectivity beamline | No | horizontal (linear) | 100-1500 eV | TEY | |
| Indus-2 | India | BL-13 Grazing Incidence X-ray Scattering | No | horizontal (linear) | 5-11 keV | GIXD, GISAXS & XRD | |
| NSLS2 (BNL) | USA | 11-BM Complex Materials Scattering | No | horizontal (linear) | 10 - 17 keV | (GI)SAXS/WAXS | |
| NSLS2 (BNL) | USA | 12-ID Soft Matter Interfaces | Yes | horizontal (linear) | 2.05 - 24 keV | (GI)SAXS/WAXS, XRD | |
| NSLS2 (BNL) | USA | 4-ID Integrated In situ and Resonant Hard X-ray Studies | No | horizontal (linear) | 6 - 23 keV | (GI)SAXS/WAXS | |
| NSLS2 (BNL) | USA | 6-BM Beamline for Materials Measurement | No | horizontal (linear) | 4 - 23 keV | GIXD, GISAXS, resonant x-ray scattering | |
| Photon Factory (KEK) | Japan | BL-18B Indian Beamline at Photon Factory | Yes | horizontal (linear) | 8-19 keV | GIXD & XRD | |
| PETRA III (DESY) | Germany | P07 The High Energy Materials Science | No | horizontal (linear) | 33-200keV | XRD & more | |
| PETRA III (DESY) | Germany | P08 High Resolution Diffraction | Yes | horizontal (linear) | 5.4-29.4keV | (GI)XRD, (GI)SAXS & more | 2012, 2014, 2022 |
| PETRA III (DESY) | Germany | P09 Resonant Scattering and Diffraction | No | variable linear, circular & fast flipping circular | 2.7keV – 31keV | REXS, XRMR+XMCD & more | |
| PETRA III (DESY) | Germany | P23 In situ X-ray Diffraction and Imaging | No | horizonal (linear) | 5keV – 35keV | (GI)XRD, anomalous diffraction, DAFS | |
| SAGA | Japan | BL15 Materials science beamline | No | Horizontal (linear) | 2.1-23keV | XRD, SAXS, XAS & more | |
| SOLEIL | France | SEXTANTS | No | linear or circular | 50 - 1800 eV | RIXS, X-ray resonant magnetic scattering, Coherent x-ray scattering | |
| SOLEIL | France | SIXS Surfaces interfaces x-ray Scattering | No | horizontal (linear) | 5 -20 keV | XRD, GIXD & more | |
| SOLEIL | France | SIRIUS Soft Interfaces and Resonant Investigation | No | horizontal (linear) | 1.4 -13 keV | GIXD, GISAXS, XAS & more | |
| SPring-8 | Japan | BL13XU Surface and Interface Structures | No | horizontal (linear) | 6-50 keV | GIXD | |
| SPring-8 | Japan | BL19B2 Engineering Science I | No | horizontal (linear) | 5-72 keV | GIXD, SAXS, XRD | |
| SPring-8 | Japan | BL37XU Trace Element Analysis | Yes | horizontal (linear) | 4.5-113 keV | XAS (please contact the beamline staff for details of reflectometry capabilities) | |
| SPring-8 | Japan | BL46XU Engineering Science III | No | horizontal (linear) | 6-35 keV | GIXD, XRD & more | |
| SSRF | China | O2U2 | Yes | horizontal (linear) | 4.8-28 keV | XRD, GIXD & more |